Hioki IM3570

Hioki IM3570, Analizador de Impedancias.

Codigo del Producto: IM3570

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(Ueda, Nagano, June 28, 2010) HIOKI E.E. CORPORATION is pleased to announce the release of the IM3570 IMPEDANCE ANALYZER in mid-July 2010. The new instrument, which provides a single-device solution for LCR, DCR, and sweep measurement, delivers dramatically shorter measuring times and improved measurement precision compared to previous HIOKI LCR HiTESTERs.
HIOKI expects the new IM3570 to drive increased sales for use in testing applications on production lines for electronic components such as coils, capacitors, and piezoelectric elements as well as in development applications at universities and research facilities operated by private-sector corporations.

Single-device solution for high-speed measurement, even when switching between different measurement conditions
The need to take readings of multiple parameters under different conditions (frequency, level) when measuring components such as capacitors sometimes necessitates the use of multiple measuring instruments on a single production line. Because the IM3570 is capable of making continuous measurements at high speed under different measurement conditions, HIOKI provides a single-instrument solution for such applications.
Twice the testing speed (compared to previous instruments)
Compared to existing HIOKI instruments such as the 3532-50, the IM3570 delivers dramatically shortened measurement times. In LCR mode, the new instrument realizes a testing speed improvement of more than 200% compared to the 5 ms measurement times typically obtained with the older design.

The benefits of the IM3570 are clear in settings such as production lines where 100% inspection of electronic components is required.
Order-of-magnitude improvement in measurement repeatability (*Over 100 measurements at 1 mƒ¶)
Low-ESR functional polymer capacitor designs necessitate measurement precision in the order of several milliohms. By improving precision during low-impedance measurement by an order of magnitude compared to previous instruments, the IM3570 ensures operatorsf ability to realize stable measurement.
Extensive range of measurement frequencies
The IM3570 allows frequency band configuration at 5-digit resolution for DC signals and within the range of 4 Hz to 5 MHz (resolution: 0.01 Hz under 1 kHz). This capability allows measurement of resonant frequencies as well as measurement and evaluation of components in a state that approaches operating conditions.
Fifteen measurement parameters
The IM3570 measures a total of 15 parameters, including Z and Y, and data can be captured to a computer as needed.
Contact check function for preventing false measurement results
The IM3570 offers contact check functionality for both two- and four-terminal measurement. By preventing measurements from being taken while the measurement electrodes are not in contact with the object under measurement, the instrument helps avoid inadvertent shipment of untested products.
Broad range of measurement currents and voltages
In addition to normal open loop signal generation, the IM3570 can take into account voltage and current dependence in constant-voltage and constant-current modes. Users can set measurement signal levels over a broad range extending from 5 mV to 5 V and from 10 ƒÊA to 50 mA (up to 1 MHz).
Measurement cables of up to 4m in length
Accuracy is guaranteed to a measurement cable length of 4 m thanks to a design that reduces the effects of cable length through the use of four-terminal-pair measurement. This feature simplifies wiring in automated testing equipment.

Measurement modes	LCR mode: Measurement under single set of conditions Analyzer mode: Sweep through measurement frequencies and measurement levels (Measurement points: 1 to 801; sweep methods: normal sweep or segmented sweep; display: list display or graph display) Continuous measurement mode: Continuous measurement under saved conditions (of which up to 32 sets can be saved)
Measurement parameters	Z, Y, ƒÆ, Rs (ESR), Rp, Rdc (DC resistance), X, G, B, Cs, Cp, Ls, Lp, D (tan ƒÂ), Q
Measurement ranges	100 mƒ¶ to 100 Mƒ¶, 12 ranges (all parameters are defined using Z)
Basic accuracy	Z: }0.08% rdg ƒÆ: }0.05‹
Measurement frequencies	4 Hz to 5 MHz (in 10 mHz to 100 Hz steps)
Measurement signal levels	Normal mode: V mode, CV mode: 5 mV to 5 Vrms (up to 1 MHz), 10 mV to 1 Vrms (1 MHz to 5 MHz), 1 mVrms steps CC mode: 10 ƒÊA to 50 mArms (up to 1 MHz), 10 ƒÊA to 10 mArms (1 MHz to 5 MHz), 10 ƒÊArms steps Low-impedance high-precision mode: V mode, CV mode: 5 mV to 1 Vrms (up to 100 kHz), 1 mVrms steps CC mode: 10 ƒÊA to 100 mArms (100 mƒ¶ and 1 ƒ¶ ranges up to 100 kHz), 10 ƒÊArms steps
Output impedance	Normal mode: 100 ƒ¶ Low-impedance high-precision mode: 10 ƒ¶
Display	5.7-inch color TFT, on/off switchable
No. of display digits setting	Number of display digits can be set from 3 to 7; default setting: 6 digits
Measurement time	0.5 ms (100 kHz, FAST, display off, representative value)
Measurement speeds	FAST/MED/SLOW/SLOW2
DC bias measurement	Normal mode: 0 to 2.50 V DC (10 mV steps) Low-impedance high-precision mode: 0 to 1.00 V DC (10 mV steps)
DC resistance measurement	Normal mode: Measurement signal level of 100 mV to 2.5 V DC (10 mV steps) Low-impedance high-precision mode: Measurement signal level of 100 mV to 1.00 V DC (10 mV steps)
Comparator	LCR mode: Hi/IN/Lo for first and third values Analyzer mode: Area judgment (Hi/IN/Lo for each point), peak judgment (Hi/IN/Lo for maximum and minimum frequencies and absolute values)
Memory function	Storage of 32,000 data points in the instrumentfs internal memory
Interfaces	EXT I/O (handler) RS-232C GP-IB USB (Hi-speed/Full-speed) USB memory LAN (10Base-T/100Base-TX)
Power supply	90 to 264 V AC, 50/60 Hz, 150 VA max.
Dimensions and weight	Approx. 330 (W) ~ 119 (H) ~ 307 (D) mm, approx. 5.8 kg

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Hioki IM3570, Analizador de Impedancias.

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