NX5000
Features | |
 | Supports full speed operation of the UUT with no modifications |
| No special fixturing required |
| Requires only one generic pod |
| Supports 8/16/32 bit ROMs |
| New processors can be added with just a software update |
| No assembly language required for use of the basic functions of the ROM emulation card |
| Basic functions include Read, Write, RAM test, ROM CHECKSUM, Fill, Copy, Move, etc. |
| Basic diagnostics are available to troubleshoot a dead kernel |
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| Automatic Test Equipment (ATE) |
| Service and repair work stations |
| Engineering evaluation |
| Microprocessor board emulation |
ROM emulation is a powerful and versatile method of microprocessor testing. ROM emulation has emerged as the technique of choice for microprocessor test and diagnostic applications. A microprocessor-based board is tested by replacing the boot ROMs on the Unit Under Test (UUT) with memory emulation pods. Each pod handles eight bits of the data bus. Processors from 8 to 32 bits can be controlled with one to four pods (even the most advanced CPUs such as the Intel Pentium generally use only an eight-bit boot path). The emulator takes control of the UUT by resetting the processor and, under the test program¡¯s control (monitor program), exercises all functions on the board. Synchronization with the UUT is automatic and requires no additional hardware or connections.
ROM emulation uses a high level language that enables the user to focus on development of the test procedure (rather than on learning new opcodes of the tested CPU) allowing rapid transition from one test program development to another with minimum learning time. The controlling link is transparent to the user.
The logic probe is available to probe UUT nodes beyond the kernel. A powerful node test system allows known good responses from a reference UUT to be stored in a library for immediate comparison against the board under test. Selecting a node test automatically invokes the correct stimulus, captures the results and compares them against the reference library. A PASS or FAIL message can be displayed or further instructions to the operator can be issued, pending the result of each node test.
A Windows GUI is included with built-in functions such as Memory Read/Write, I/O Read/Write, Memory Test, etc. Higher-level functions can also be executed with a single command. A built-in macro language supports easy development of the complex test procedures without the need to learn a programming language.
The NX5000 Series is supplied with a software package that includes a virtual panel stand-alone application, driver, and on-line documentation. The virtual panel can be used to interactively control the instrument from a window that displays the current instrument settings and allows you to control and change them. The driver is a library of functions that is used to control and change the instrument settings from within your application. The instrument driver is provided for Windows operating system (32 bit DLL). In addition to the driver library, various interface files provide access to the library from your favorite programming tools and languages. These interface files support programming from ATEasy, Microsoft and Borland C/C++, Microsoft Visual Basic, Borland Delphi and more.
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| Boot ROM Path | 8 and 16 bits (NX5000) 8 and 32 bits (NX5100) |
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| Trigger Bus | |
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| Output | Breakpoint, SW Out User Trigger R/W Trigger UUT Reset Trigger |
| Input | GP-In1, GP-In2 Status |
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| Supported Rom Types | |
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| Size | 64 Kbits to 8 Mbits |
| Package | 28 or 32 pin DIP or PLCC. Other styles available by special request. |
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| Access Time | 55 nS or less |
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| Stimuli Output | |
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| Software controlled signals | sourcing or sinking 60 mA |
| Reset Overdrive Line | Drive Current: 64 mA |
| Level | Software selectable high and low pulse |
| Pulse Width | 1 ms to 10 s |
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| Microprocessor Emulation Speed | Maximum rated execution speed with no wait states |
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| Pod Signal Loading | 100  |
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| Pod Cable Lengths | NX5000 to Pod: 5 feet Pod to Rom socket: 8¡± |
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| Number of General Purpose I/O Pins | 16 bits of general purpose I/O lines; each line can be configured as input or output. |
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| Log Probe Specifications | The optional NT5700- Probe is capable of measuring frequencies, logic levels, edge counts and CRC¡¯s. Max sample rate is 100MS/sec and input impedance is 100Kohm |
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| Size | Available in 3U and 6U |
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| Temperature Range | 0¢ªC - 85¢ªC |
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One or Two 80-pin high-density connector(s) supporting two 8-bit or one 16-bit pod.
